特价美国parker公司DA400S便携式磁粉探伤仪

DA400S便携式磁粉探伤仪

● 美国波音公司航空维修手册指定产品
● 采用了许多先进技术来形成感应磁场，具有极高通用性
● 控制器与固态电子器件为一体的高性能的轻便仪器
● 固定的AC或DC磁场，用于表面和近表面缺陷的检测
● 磁轭轻便，使用干粉湿性荧光磁粉
● 磁极可将AC或DC磁场施加到各种形状工件的检测区域，没有电弧烧伤

DA400S便携式磁粉探伤仪技术指标

DA-400 Series Contour Probes

• Versatility and powerful performance in a lightweight (8.5 lbs.) instrument
• ConstantAC or Half Wave Rectified (DC)fields with the flip of a switch for the location of surface and some sub-surface defects
• Apply continuous fields and demagnetize too
• Use with dry powder, wet fluorescent or visible
• High impact molded housing
• One year repair/replacement guarantee
• Optional Y-400 Yoke Light where shown is available at additional cost

The DA-400 Contour Probe is a portable, self-contained instrument designed to produce a magnetic field on or within ferrous-magnetic materials.

The selective AC and DC functions are built into a single reliable instrument. The AC mode produces an intense AC field for detection of surface defects and demagnetizing after inspection. The DC mode produces an intenseHalf Wave Rectified (DC)field for detection of some subsurface defects.

Controls and solid-state electronics are contained within the high impact molded housing. Articulating legs allow the AC or DC field to be applied to the precise area of inspection on nearly any part of the surface shape... in the lab, factory or field site.

All Parker Contour Probes comply with the requirements of applicable specifications. Certified for European CE requirements.

SPECIFICATIONS